Webinars and Videos

Upcoming Webinar: Lizard Lessons with CMT's Brian Walker

2019 Jul 18 03:00 PM UTC

CMT’s Senior RF Design Engineer Brian Walker will discuss several features of Copper Mountain Technologies’ software, demonstrate various useful VNA measurements and answer viewer questions.

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Mixer Measurements Demo at IMS 2019

Subbaiah Pemmaiah, an Application Engineer at Copper Mountain Technologies demonstrates mixer measurements using a VNA and frequency extenders at IMS 2019.

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Diplexer Tuning with RNVNA Software

Tuning a diplexer can be challenging. But having all the right tools can make it easier. In this video, we show how three R60 1-port VNAs can be used to measure all three ports of the diplexer simultaneously. This greatly simplifies the tuning procedure which tends to be highly interactive. Alternatively, an affordable TR1300/1 2-port VNA or a 4-port Cobalt C1409 VNA might also be used.

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Introduction of PXIe-S5090 at IMS 2019

Alex Goloschokin (Copper Mountain Technologies) and Jason White (National Instruments) share details on the new PXIe-S5090 VNA that will be released in August 2019.

 

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Probe Measurements with a Robot and 1-Port VNA

From IMS 2019, John Shultz of Compass Technology Group demonstrates how to perform an automated scan of an aircraft radome to detect potential flaws. To make this measurement, a robot with a mounted R180 VNA is directly connected to a spot probe antenna. Watch the demonstration to learn more.

 

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Using Microwaves for Materials Measurement

In this webinar Sonomatic’s Microwave Inspection Manager, Donald McNicol, explains how microwaves can be used to non-destructively examine non-metallic and composite materials for manufacturing or service induced defects. A technique used for the inspection of deep-water pipelines and other composite materials. Please register below to receive access to this on-demand webinar. 

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Antenna Component Testing

Jay Thompson, Vice President of Tactical RF delivers a demo featuring a standard two-way radio antenna system. He uses Copper Mountain Technologies’ R60 1-Port 6 GHz Analyzer to test each component of the antenna system, and does a system line sweep to demonstrate what a proper antenna setup should look like. Please register below to receive access this on-demand webinar.

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Handheld Materials Testing Without a Test Cable - R140 and DAKS

Ferenc Muranyi, DAK Product Head for Schmid & Partner Engineering AG, showcases the DAKS-3.5 system which includes Copper Mountain Technologies’ R140 VNA.

 

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What is a Smith Chart?

Brian Walker, Senior RF Design Engineer at Copper Mountain Technologies looks at how a Smith Chart is simply a special case of the polar plot and how the real and imaginary axes are constructed in this video.

 

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Time Domain Reflectometry Measurements with a Vector Network Analyzer

Time Domain Reflectometry (TDR) has traditionally been performed using a fast oscilloscope and a very sharp impulse or step type excitation. Reflections from the excitation are measured at the source and distance and the magnitude of the reflection coefficient may be ascertained from the delay and magnitude of the returning reflected signal. This measurement is performed in a very wide band measurement and the signal to noise ratio can be quite poor because of this. TDR performed using a Vector Network Analyzer (VNA) allows for the measurement to be made in a narrow RF bandwidth with a corresponding large improvement in signal to noise ratio. This method, utilizing the reverse Fourier Transform on a VNA is clearly superior.
 

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A New Method for Dielectric Property Measurements

Dielectric properties are important for design of antenna and wireless tech. Materials Measurement expert Dr. John Schultz from Compass Technology Group explains the new dielectric materials measurement method. If you would like to see more content about materials measurement, you can find information here. To view the recording of this webinar, select the ‘Register Now’ button below.

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In-Circuit Antenna Verification

Brian Walker, Senior RF Design Engineer at Copper Mountain Technologies shows how there can be significant variation of performance of a PCB mounted antenna when it is close enough to other objects to disturb the near field response. It is best to measure the return loss of an embedded antenna in its final configuration and be prepared to add matching elements to improve radiation efficiency. Careful consideration of the location of the calibration plane of a vector network analyzer measurement is important to derive matching circuit element values.

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Simplify Your IoT Antenna Testing and Accelerate Your Product Development

In the IoT world, time to market is essential and developing a new product has enough hurdles as such. It is important to know how to test and optimize the antenna’s performance. Antenna experts Olivier Robin and Gregory Makar covers this information in the webinar recording. They also review the new IoTest™ kit PulseLARSEN has developed (powered by Copper Mountain Technologies) to explain how to accelerate the process of embedding antennas in your product, to evaluate your antenna performance, to compare to existing Pulse antennas, and to consult experienced antenna professionals if any further assistance is required.

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VNA Impedance Measurement for Power Distribution Networks

Almost all modern circuits are sensitive to power quality, which to a large extent is a measurement of the power rail impedance. This is because flat impedance power rails result in much lower noise than power rails that aren’t flat. In RF circuits the peaks generally result in increased phase noise, while in digital circuits the issues are related to the allowed voltage window for the ASIC’s. In high-speed transceivers, these peaks result in jitter, which is also related to phase noise. In analog circuits, the peaks can result in increased noise density and in analog to digital converters the peaks result in spurious responses. The power rail impedance is typically controlled by the careful selection of bulk aluminum or tantalum capacitors, ceramic decoupling capacitors, inductors, and ferrite beads.

The instrument of choice for these impedance measurements is a vector network analyzer and the most common and highest accuracy measurement is the 2-port shunt through technique, using a 2-port VNA. The VNA offers the excellent dynamic range and also wide bandwidth.

Please register below to receive access to this on-demand webinar.

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Accurate Cable Measurement Technique Using a Purpose-Built Automatic Calibration Module with a VNA

Copper Mountain Technologies’ VNAs are used for various test and measurement applications. A fundamental requirement of most test systems is to have a good RF coaxial cable. RF coaxial cables are transmission lines which help transfer energy from one end to the other. So, it is critical to have the best performing cable which transfers the most energy possible. Copper Mountain Technologies also manufacture Automatic Calibration Modules (ACMs), which are primarily used to obtain highly accurate automated calibrations. The purpose of this seminar is to focus on how to test a cable accurately using an ACM.

Please register below to receive access to this on-demand webinar.

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Principles of Operation of the Epsilometer

John Schultz, Ph.D., of Compass Technology Group describes the principles of how the new Epsilometer operates.

Learn more about the Epsilometer here.

 

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Demo of Epsilometer, a Dielectric Materials Measurement Device

John Schultz, Ph.D., of Compass Technology Group describes how to use the new Epsilometer, a dielectric properties measurement device.

Learn more about the Epsilometer here.
 

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Making 75 Ohm Measurements with a 50 Ohm VNA

There may be instances where you need to make a 75 Ohm measurement, but you don’t have to have a 75 Ohm VNA. It is possible to use a 50 Ohm VNA to make accurate 75 Ohm measurement. All that is required is to use the proper physical adapters and use a 75 Ohm calibration kit to perform calibration. Senior RF Design Engineer Brian Walker describes how to do such a measurement.
 

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Vector Network Analyzer Measurement of S-Parameters in a Pulsed RF System

Copper Mountain Technologies’ Senior Design Engineer Brian Walker demonstrates how to make Pulsed S-parameter Measurements.
 

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How to De-embed an S-Parameter File From a VNA Measurement

De-embedding is the process of eliminating something from your measurement, such as a filter or fixture. When you de-embed you eliminate the effect of something you don’t need to measure so your results are more accurate. Senior RF Design Engineer Brian Walker shows how to use a 4.8 GHz Copper Mountain Technologies VNA to make de-embedded measurements.
 

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A Quick Guide for How to Perform Differential Measurements on a Cable in Frequency and Time Domain

Differential signal impairment caused by transport through various media is becoming more important with the ever increasing demand for high data rates in digital data systems. This drives the need for differential transmission lines to be properly characterized in frequency and time domain. CMT Application Engineer Subbaiah Pemmaiah provides a quick guide on differential measurements on a cable in frequency and time domain analysis.
 

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Teaching E&M with a Network Analyzer

Dr. Allen Katz presented how his lab at the College of New Jersey uses USB VNAs. Interested in hearing more about Dr. Katz and his RF program? View the recording for this webinar as he discusses 2-port measurements, S parameters, impedance matching and the design projects his students participate in.

Please register below to receive access to the recording of this webinar.

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Capabilities of USB VNAs

Copper Mountain Technologies’ VNAs are lab-quality USB based instruments that provide high accuracy and wide dynamic range to make measurements possible up to 110 GHz. In a USB VNA the processing module is separated from the measurement module which takes advantage of the processing power of modern PCs while producing the same reliable measurement results as any traditional analyzers would. Superior hardware designs in these instruments have helped achieve dynamic range as high as 162 dB and measurements speed as fast as 10 microseconds per point.

The purpose of this webinar is to provide an insight into the usability of CMT VNAs and trends in the industry to use this instrument to adapt to different application requirements.

Please register below to receive access to the recording of this webinar.

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New Developments in Microwave Materials Measurements Webinar

Fundamental to microwave device design is knowing the electromagnetic performance of materials used in the device. Whether it is a microwave substrate, an antenna radome, or an electromagnetic inference absorber, methods are needed to evaluate materials and determine their intrinsic dielectric and magnetic properties. Designers use these intrinsic parameters (permittivity and permeability) to develop or optimize microwave and RF components. Measuring the performance of microwave materials requires a system that includes i) a measurement fixture and ii) a microwave analyzer. The fixture and the analyzer are usually connected with microwave or radio frequency (RF) cables.

Please register below to receive access to the recording of this webinar.

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