VNAs for Materials Measurement
Perfect for Lab and Field Testing
Our VNAs are used for a variety of materials measurement applications. From NASA estimating fuel levels in the fuel tank with 1-Port reflectometers to Compact and Cobalt analyzers incorporated into portable, table-top free-space measurement systems that take materials RF measurement out of the lab and into the field or manufacturing environment to measuring moisture and sugar content in crops, liquid level in bottles of soft drinks and other food quality parameters using microwave sensor systems.
The NEW Epsilometer measures dielectric properties of materials to 6 GHz. The use of vector network analyzers is an efficient and reliable approach to measure and optimize the dielectric properties of tested materials.
Materials Measurement Integration
Compass Technology Group (CTG) is focused on taking innovative materials measurement research to product. CTG integrates Copper Mountain Technologies’ network analyzers into their systems with probes. Their systems include conventional and advanced measurements, such as free space, resonant cavity, and waveguides.
Together with CMT, Compass Technology Group has developed the Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.
Compass Technology Group (CTG) & Copper Mountain Technologies (CMT) have developed advanced microwave sensor systems for non-contact measurements to monitor real-time / in-line quality of packaged food.
AMMP Spot Probes
Compass Technology Group develops and utilizes specialized probes that enable the measurement of materials in a number of unique environments. CTG’s recently developed spot probe technology called Advanced Microwave Mapping Probes (AMMP) is a significant improvement over traditional dielectrically loaded horns due to optimized metal radiating elements, dielectric loading, and shape. The spot probes are specially designed antennas encapsulated in a dielectric and optimized to provide a small illumination spot 3 to 8 cm in front of the probe.
This Comparison of Materials Measurement Accuracy of RF Spot Probes to a Lens-Based Focused Beam System weighs the performance of CTG’s AMMP Spot Probes against the well-established free-space focused beam technique for microwave characterization of materials.
Take an in-depth look at the AMMP Spot Probes available from CTG.
Custom AMMP Measurement Systems Featuring CMT VNAs
Compass Technology Group has developed several custom measurement solutions that feature their AMMP Spot Probes in combination with a CMT VNA to tackle complex measurements.
This portable, handheld reflectometer system is suitable for point inspection of RF coatings and materials. This system provides 2-18 GHz surface reflectivity measurement using CTG’s RF spot probe technology. This system integrates with a 1-port VNA from CMT, eliminating the RF cable and enabling faster, more reliable measurements.
The table-top free-space measurement system can replace the industry-standard laboratory-focused beam system, at less than a third of the price, and a fraction of the space. The system pictured above features CMT’s S5243 VNA to determine transmission and/or reflection of materials.
Microwave Calipers Measurement System
This lightweight and adjustable fixture secures wideband 2-20 GHz probes at the proper alignment and distance for optimal measurements. It is versatile and easy to use with multiple specimen types and sizes. The RF spot probes can even be removed and used as hand-held measurement devices on specimens that are too large to fit in the largest setting. This system extends the application capabilities from the lab where a tabletop setup is likely the best option, to include the production setting where the user may want QA measurement capabilities for oddly shaped, sized, and positioned DUTs.