Epsilometer - Dielectric Materials Measurement

Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.

 

This solution uses a new methodology, according to Dr. John Schultz of Compass Technology, “Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss. This represents a significant advance over conventional methods, which use analytical approximations and are limited to frequencies below 1 GHz.”

 

The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.

 

The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.

– Frequency range: 3 MHz to 6 GHz

– Impedance: 50 Ohm

– Sheet thickness 0.3 to 3 mm

– The database is populated up to a permittivity of 25

– Suitable for testing ceramics (sample surface must be flat)

 

Datasheets

Epsilometer Information Sheet

Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications.

 

View our Applications page to see how CMT VNAs are already extending the reach of engineers in many industries and applications.

 

If you want to consult with our engineers about your specific application, please Ask an Engineer.

$ 14,995.00 USD
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A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz

A New Method of Dielectric Property Measurements

Principles of Operation of the Epsilometer