Compass Technology Group develops and utilizes specialized probes that enable the measurement of materials in a number of unique environments. CTG’s recently developed spot probe technology called Advanced Microwave Mapping Probes (AMMP) is a significant improvement over traditional dielectrically loaded horns due to optimized metal radiating elements, dielectric loading, and shape. The spot probes are specially designed antennas encapsulated in a dielectric and optimized to provide a small illumination spot 3 to 8 cm in front of the probe.
This Comparison of Materials Measurement Accuracy of RF Spot Probes to a Lens-Based Focused Beam System weighs the performance of CTG’s AMMP Spot Probes against the well-established free-space focused beam technique for microwave characterization of materials.
Take an in-depth look at the AMMP Spot Probes available from CTG.