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Making Material Measurements with a VNA on Microwave Journal

June 16, 2025

The article “Making Material Measurements with a VNA,” authored by Brian Walker from Copper Mountain Technologies, was published in the March 2025 issue of Microwave Journal . It explains the methodologies for assessing the RF properties of materials using a Vector Network Analyzer (VNA), emphasizing the significance of understanding a material’s complex permittivity and permeability in various applications.

The article outlines two primary techniques for material characterization: free-space measurements and waveguide-based measurements. In the free-space method, microwave or millimeter-wave signals are directed perpendicularly onto a flat material sample with known thickness. The VNA, connected to a pair of antennas, measures the reflection and transmission coefficients (S-parameters) of the material. Time-domain gating is employed to isolate the sample’s response, eliminating interference from stray reflections. Alternatively, waveguide-based systems, such as the MCK measurement system from SwissTo12, place the material under test (MUT) between two corrugated horn antennas. The S-parameters are then measured, and mathematical inversion techniques are applied to derive the material’s complex permittivity.

The article also discusses the computational aspects of determining complex permittivity. It explains that the inversion process involves modeling the transmission and reflection properties of the MUT when illuminated by a plane wave. The material is conceptualized in three zones: two infinitesimally thin surfaces representing reflections and a central section modeling signal transmission. By analyzing these zones and applying transfer parameters, the complex permittivity is computed.

For professionals seeking to deepen their understanding of material characterization using VNAs, this comprehensive article offers valuable insights and practical methodologies. The full article is available on Microwave Journal’s website.