VNA Master Class – Effects of Random Factors on the Metrology of VNA Measurement
Contributing factors to the uncertainty of a VNA measurement can be either random or systematic. Systematic errors may be greatly reduced through a calibration process such as Short, Open, Load and Thru (SOLT) or Thru, Reflect and Line (TRL), or any of a number of other methods. Random factors cannot be reduced by any algorithmic means because they are naturally random and unpredictable. However, certain measurement techniques can reduce them, which will be the topic of this webinar.
