University Kit
Copper Mountain Technologies is announcing an End-of-Sale (EOS) for the University model VNAs. This product is no longer available for purchase as of May 1st, 2023. We will provide service and repair for this instrument for a minimum of 3 years from the EOS date and based on parts availability afterwards. The RF Teaching Kit of curriculum and accessories is still available to purchase for either 3 GHz or 8 GHz testing.
Copper Mountain Technologies’ University Kit is a complete solution designed to assist educational institutions as they teach RF skills to engineering students. The kit has three options of vector network analyzer models in 3 GHz or 8 GHz frequency range and includes the calibration module, a few devices under test (DUTs), and accessories necessary for an array of common VNA measurements. The kit also includes sample laboratory curriculum for teaching using the tools in the kit.
CMT304U VNA Specifications
CMT804U VNA Specifications
CMT808U VNA Specifications
Datasheets
CMT304U Extended Specifications
The University Kit combines RF theory with a robust hands-on VNA experience. The solution includes materials to promote class interest and CMT’s applications engineers can assist with creating labs designed to walk students through common VNA measurements. The University Kit is backed by comprehensive support from Copper Mountain Technologies’ expert engineers.
View our Applications page to see how CMT VNAs are already extending the reach of engineers in many industries and applications.
If you want to consult with our engineers about your specific application, please Ask an Engineer.
Datasheets
University Kit Data Sheet | CMT304U Extended Specifications | CMT804U Extended Specifications | CMT808U Extended Specifications
Software
The University Kit Includes:
1.5 GHz Reactel Bandpass Filter for CMT304U VNA
4 GHz Reactel Bandpass Filter for CMT804U VNA
Reactel Diplexer for CMT808U VNA
Sample laboratory curriculum that will help to use what is in the kit and teach RF fundamentals in classes.
