Lowering Cost of Testing for Semiconductor Manufacturers
For most VNA applications, especially when test results are collected manually by an operator, measurement speeds on the order of 15 microseconds per point are more than adequate. However, in certain applications including semiconductor production, such measurement speeds can contribute significantly to test time being a bottleneck in the overall manufacturing process.
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Copper Mountain Technologies USB VNAs offload the processing of the measurement to a host computer. This makes our test equipment much smaller and easier to embed in a test system. Our focus on the RF measurement instead of computation hardware results in a lower cost measurement device for semiconductor testing with excellent accuracy and metrology.
Compact VNA Series up to 18 GHz
Compact VNAs have a dynamic range up to 140 dB which allows them to maintain a wide measurement range at high measurement speeds.
Cobalt VNA Series up to 20 GHz
Cobalt VNAs have up to 152 dB dynamic range which allows them to maintain a wide measurement range at high measurement speeds.
CobaltFx Frequency Extension Solution
CobaltFx cost-effective millimeter wave frequency extension system allows you to build a scalable and affordable 5G testing solution.