Webinar: New Developments in Microwave Materials Measurements

Tabletop Materials Measurements

Fundamental to microwave device design is knowing the electromagnetic performance of materials used in the device. Whether it is a microwave substrate, an antenna radome, or an electromagnetic inference absorber, methods are needed to evaluate materials and determine their intrinsic dielectric and magnetic properties. Designers use these intrinsic parameters (permittivity and permeability) to develop or optimize microwave and RF components. Measuring the performance of microwave materials requires a system that includes i) a measurement fixture and ii) a microwave analyzer. The fixture and the analyzer are usually connected with microwave or radio frequency (RF) cables.

New Developments in Microwave Materials Measurement
Fill out the following information to receive an email with the link to watch this webinar. Please allow a few minutes for the email to reach your inbox.
First Name
Last Name
Email
Phone
Company Name
State
Country
How did you hear about us?
By submitting this form, you consent to receiving periodic emails from Copper Mountain Technologies.  Occasionally our responses are considered spam by email management software, so please check your junk folder for emails from any address @coppermountaintech.com or @copper-mountain-technologies.odoo.com. To ensure you always get our emails please whitelist coppermountaintech.com and copper-mountain-technologies.odoo.com domains. All information submitted to Copper Mountain Technologies is for internal purposes only and will not be shared with any third parties. Please visit our Privacy Policy for more information.

Related Content

A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz

APP NOTE

Demo of Epsilometer, a Dielectric Materials Measurement Device

Video