Automatic Fixture Removal (AFR) removes the effects of probes, cables, PCB traces, and test fixtures from VNA measurements, effectively moving the measurement reference plane closer to the device under test.

This makes AFR particularly valuable for in-circuit measurements. Isolate a component or circuit section, probe it directly, and use AFR to de-embed the probes and interconnects. You can characterize the device without needing to remove it from the board or design a dedicated coaxial test interface.

AFR can also be used to characterize components on PCB test coupons, remove connector and trace effects, and simplify on-board antenna tuning by de-embedding temporary coaxial pigtails connected near the antenna matching network.

The intuitive AFR software guides users through fixture characterization and de-embedding, while providing advanced methods for a wide variety of measurement configurations.

Compatible with CMT A-series VNAs and compact two-port, two-path VNA models.