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Discontinued: Epsilometer - Dielectric Materials Measurement
Copper Mountain Technologies is announcing that the Epsilometer is discontinued and no longer available for purchase as of August 13, 2024. For any materials measurements questions or necessary solutions, please reach out to the experts at Compass Technology Group.
Epsilometer solution for measuring the dielectric properties of materials measures dielectric substrate materials at frequencies from 3 MHz up to 6 GHz and can accommodate sheet specimens 0.3 to 3 mm thick.
The Epsilometer solution includes R60 VNA with software, measurement fixture, Epsilometer software, and calibration sample.
The Epsilometer solution has been developed in collaboration with Compass Technology, a leading provider of material measurement solutions and systems.
– Frequency range: 3 MHz to 6 GHz
– Impedance: 50 Ohm
– Sheet thickness 0.3 to 3 mm
– The database is populated up to a permittivity of 25
– Suitable for testing ceramics (sample surface must be flat)
Epsilometer can be used in design and manufacturing of microwave circuit materials, antenna radomes, antenna substrates, packaging for wireless devices – 4G/LTE, WiFi, Bluetooth, 5G, IoT, etc. – and many other applications.
View our Applications page to see how CMT VNAs are already extending the reach of engineers in many industries and applications.
If you want to consult with our engineers about your specific application, please Ask an Engineer.
Manuals
Epsilometer Operating Manual | Dielectric Analyzer for Rapid Measurement | Uncertainty Measurement
Software
If using the original Epsilometer V1 hardware, you must download and use the Epsilometer V1 software. Epsilometer V2 hardware versions are indicated on the units and must use the Epsilometer V2 software.
