Lowering Cost of Testing for Semiconductor Manufacturers
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Copper Mountain Technologies USB VNAs offload the processing of the measurement to a host computer. This makes our test equipment much smaller and easier to embed in a test system. Our focus on the RF measurement instead of computation hardware results in a lower cost measurement device for semiconductor testing with excellent accuracy and metrology.
USB VNA Series up to 18 GHz
High-performance 2-port VNAs up to 18 GHz, optimized for production and materials measurement and include only the essential functionalities tailored for production and materials testing.
Advanced VNA Series up to 20 GHz
High-performance 2-port VNAs up to 22 GHz suitable for advanced applications like research and design, automotive and defense radar development, satellite communications, and high-speed digital systems.
BFx-02 Frequency Extension Base is a patent-pending solution designed to simplify and reduce the cost of mmWave S-parameters measurement. By eliminating the need for a full-featured VNA in frequency extension setups, the BFx-02 base enables a more streamlined and accessible approach to mmWave testing.
