Command |
Description |
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Sets low pass mode (Fstart = Fstep), changing Fstart: Fstart - start frequency Fstep - step frequency |
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Sets low pass mode (Fstart = Fstep), changing Fstep and Fstart to 10 MHz: Fstart - start frequency Fstep - step frequency |
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Performs input and output reflection measurement of the fixture with the DUT. Measurement results are used to correct the resultant S-parameters of the fixture, specifically the reflection coefficients. Other S-parameters remain unchanged from the previous measurement steps, including the entered calibration plane offset values. |
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1xReflect method. Sets the offset value of the fixture calibration plane in the <Step> measurement step. First, activate the calibration plane offset mode by the AFR:SYST:STEP<Step>:REF:OFFS 1 command. |
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1xReflect method. Performs fixture reflection measurement in the Open state at the <Step> measurement step. First, activate the measurement mode by the AFR:SYST:STEP<Step>:REF:OPEN 1 command. |
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1xReflect method. Performs fixture reflection measurement in short-circuit mode (Short state) at the <Step> measurement step. First, activate the measurement mode by the AFR:SYST:STEP<Step>:REF:SHOR 1 command. |
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2xThrough method. Performs S-parameters measurement of two connected fixtures at the <Step> measurement step. The command is valid for all possible configuration sets: A-B, A-A aux, B-B aux. |
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2xThrough method. Sets the offset values of the fixture calibration plane at the <Step> measurement step. First, activate the calibration plane offset mode by the command AFR:SYST:STEP<Step>:THRU:OFFS 1. |
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2xThrough → 1xReflect calibration plane offset determination by 1xReflect method. Performs fixture reflection measurements in the Open state at the <Step> measurement step to automatically determine the offset values of the calibration plane. First, activate the measurement mode by the AFR:SYST:STEP<Step>:THRU:REFOFFS:OPEN 1 command. |
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2xThrough measurement → 1xReflect calibration plane offset determination by 1xReflect method. Performs fixture reflection measurements in the Short state at the <Step> measurement step to automatically determine the offset values of the calibration plane. First, activate the measurement mode by the AFR:SYST:STEP<Step>:THRU:REFOFFS:SHOR 1 command. |
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Sets a custom impedance value. |