SCPI Command
AFR:CALCulate:STEP<St>:THRU:REFOFFSet:SHORt
Description
2xThrough measurement → 1xReflect calibration plane offset determination by 1xReflect method. Performs fixture reflection measurements in the Short state at the <Step> measurement step to automatically determine the offset values of the calibration plane. First, activate the measurement mode by the AFR:SYST:STEP<Step>:THRU:REFOFFS:SHOR 1 command. |
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no query |
Target
Measurement step <Step> of two fixtures,
<Step> = {1|2|...}
Related Commands
AFR:SYSTem:STEP<Step>:THRU:REFOFFSet:SHORt
Related Controls of User Interface
Fixture measurement > Step <Step> of N > 2xThrough method > Apply fixture F1/F2 calibration plane offset using reflects > Short > Measure
F1 - name of the left fixture,
F2 - name of the right fixture,
N - maximum number of steps.
Back to AFR:CALCulate
