The following section describes the process of Measurement Data Analysis using the Analyzer.
Special software marker tools are used to read and look up the numerical values of the stimulus and the measured value on selected points on the graph. For a detailed description, see Markers.
This section also contains information about the various functions and tools used to analyze measurements.
•Memory Trace Function is used to save data traces and perform mathematical operations between memory and data traces.
•Trace Hold is used to hold the maximum or minimum values of the trace.
•Fixture Simulation is used to simulate measurement conditions that differ from real measurement conditions.
•Time Domain Transformation is used to convert the measured characteristics in the frequency domain into the circuit response in the time domain.
•Time Domain Gating (except M models) is used to eliminate unwanted responses in the time domain.
•S-Parameter Conversion is used to convert the measurement results into different parameters: impedance or admittance in reflection/transmission measurement, inverse S-parameter, equivalent impedance or admittance in transmission shunt measurements, S-parameter complex conjugate.
•General S-Parameter Conversion is used for general conversion of S-parameters to Z, Y, T, H, ABCD-parameters based on the full matrix of S-parameters.
•A function of pass/fail determination for the trace of the measurement data according to various criteria:
1.Limit Test is used to compare the trace of the measured value with the limit line.
2.Ripple Limit Test is used to check the value of the ripple trace with user-defined ripple limits
3.Peak Limit Test is used to check if the peak of the trace of the set polarity falls within the limits for the peak.
