Improved bisect de-embedding for Analyzer measurements or simply Bisect. This method splits a set of measured S-parameters of a reciprocal fixture that has S21 
S12 and S11 ≠ S22 into two halves. To perform this splitting, only frequency domain data is used. Bisect allows de-embedding when the electrical length of the fixture is not enough to provide appropriate time domain resolution, and the use of time-based methods, such as Time-Gating or Filtering, is not possible. This method does not possess the filtering property and is not able to separate different signals along fixture length.
note |
In order to achieve suitable measurement results by using the Bisect method, the fixture should have a sufficiently low reflection level. The recommended level is no higher than -20 dB over the desired frequency range. It is assumed that the VNA will have an impedance Z0 at each port. The bisect method works only with 2xThrough measurements (where fixture A and B are connected to each other). It does not support 1xReflect technique. |
Signal Flow Graph for Demonstration of S-parameters Assignment for Each Fixture
System of Equations for Finding S-parameters of Each Fixture:
