Network Analyzers using TRVNA software

Measured parameters

S11, S21

Absolute power of the incident, reflected or transmitted DUT signals.

Number of measurement channels

Up to 9 channels. Each channel is represented on the screen as an individual channel window. Each channel has its own stimulus signal settings such as frequency range, number of test points, power level, etc.

Data traces

Up to 8 data traces can be displayed in each channel window. A data trace represents one of the following parameters of the DUT: S-parameters, response in time domain, input power response.

Memory traces

Each of the 8 data traces can be saved into memory for further comparison with the current values. Up to 8 memory traces can be created for each data trace.

Data display formats

Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR, real part, imaginary part, Smith chart format, and polar format.

Sweep type

Linear, logarithmic, and segment frequency sweep, when the stimulus power is a fixed value.

Power sweep

Linear power sweep when the frequency is a fixed value.

Measured points per sweep

From 2 to 16,001 for TR1300/1.

From 2 to 200,001 for TR5048 and TR7530.

Segment sweep

A frequency sweep within several user-defined segments. Frequency range, number of points, source power, and IF bandwidth can be set for each segment.

Power settings

Source power from -55 dBm to +5 dBm (from -55 dBm to +3 dBm TR1300/1) with resolution of 0.05 dB. In frequency sweep mode the power slope can be set to up to 2 dB/GHz to compensate high frequency attenuation in cables.

Sweep trigger

Trigger modes: continuous, single, hold. Trigger sources: internal, external, bus. The availability of this feature depends on the Analyzer model.

Trace display

Data trace, memory trace, or simultaneous data and memory traces.

Trace math

Data trace modification by math operations: addition, subtraction, multiplication or division between the data, and memory traces.

Autoscaling

Automatic selection of the scale division and reference level value to have the trace most effectively displayed.

Reference level automatic selection

Automatic selection of the reference level. After selection, the data trace shifts vertically so that the reference level crosses the trace in the middle.

Electrical delay

Linear phase correction according the specified electrical delay.

Phase offset

Phase offset by the specified value in degrees.

Calibration

Calibration of a test setup (which includes the Analyzer, cables, and adapters) significantly increases the accuracy of measurements. Calibration allows correction of errors caused by imperfections in the measurement system: directivity, source, and load match, tracking, and isolation.

Calibration methods

The following calibration methods of various sophistication and accuracy enhancement are available:

•reflection and transmission normalization

•full one-port calibration (SOL)

•one-path two-port calibration

Reflection and transmission normalization

The simplest calibration method. It provides limited accuracy.

Full one-port calibration (SOL)

Method of calibration performed for one-port reflection measurements. It ensures high accuracy.

One-path two-port calibration

Method of calibration performed for reflection S11 and one-way transmission measurements S21. It ensures high accuracy for reflection measurements, and reasonable accuracy for transmission measurements.

Mechanical calibration kits

It is possible to select one of the predefined calibration kits of various manufacturers or define additional ones.

Electronic calibration modules

Copper Mountain Technologies’ automatic calibration modules (ACM’s) make Analyzer calibration faster and easier than traditional mechanical calibration and provides the highest accuracy.

Defining of calibration standards

Different methods of calibration standard definition are available:

•standard definition by polynomial model

•data-based standard (full S-parameter characterization data)

Error correction interpolation

When such settings as start/stop frequencies and number of points are changed, compared to the settings of calibration, interpolation or extrapolation of the calibration coefficients will be applied (Extrapolation is not recommended).

Port Extension

Calibration plane compensation for delay in the test setup.

Power calibration

Method of the port power calibration which allows to maintain more stable power levels at the DUT input. The calibration requires connection of an external USB power meter.

Data markers

Up to 16 markers for each trace. A marker indicates the stimulus value and measurement result at a given point of the trace.

Reference marker

Enables indication of any maker value as relative to the reference marker.

Marker search

Search for max, min, peak, or target values on a trace.

Marker search additional features

User-defined search range. Available as either a tracking marker, or as a one-time search.

Setting parameters by markers

Setting of start, stop, and center frequencies from the marker frequency, and setting of reference level by the measurement result of the marker.

Marker math functions

Statistics, bandwidth, flatness, RF filter.

Statistics

Calculation and display of mean, standard deviation and peak-to-peak values of the trace.

Bandwidth

Determines bandwidth between cutoff frequency points for an active marker or absolute maximum. The bandwidth value, center frequency, lower frequency, higher frequency, Q value, and insertion loss are displayed.

Flatness

Displays gain, slope, and flatness between two markers on a trace.

RF filter

Displays insertion loss and peak-to-peak ripple of the passband, and the maximum signal magnitude in the stopband. The passband and stopband are defined by two pairs of markers.

Port impedance conversion

This function converts S-parameters measured at the Analyzer’s nominal port impedance into values which would be found if measured at arbitrary port impedance.

De-embedding

This function allows mathematical exclusion of the effects of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.

Embedding

This function allows mathematical simulation of the DUT parameters after virtual insertion of a fixture circuit between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.

S-parameter conversion

This function allows conversion of the measured S-parameters to the following parameters: reflection impedance and admittance, transmission impedance and admittance, and inverse S-parameters.

Time domain transformation

This function performs transformation from frequency domain into response of the DUT to various stimulus types in time domain. Modeled stimulus types: bandpass impulse, lowpass impulse, and lowpass step. Time domain span is set  arbitrarily from zero to maximum, which is determined by the frequency steps. Various window shapes allow optimizing the tradeoff between resolution and the level of spurious sidelobes.

Time domain gating

This function mathematically removes unwanted responses in time domain, allowing for measurement of the frequency response without the influence of selected fixture elements. Gating filter types: bandpass or notch. For better tradeoff between gate resolution and the level of spurious sidelobes the following filter shapes are available: maximum, wide, normal, and minimum.

Scalar mixer / converter measurements

The scalar method allows measurement of scalar transmission S-parameters of mixers and other devices having different input and output frequencies. No external mixers or other devices are required. The scalar method employs port frequency offset when there is a difference between receiver frequency and source frequency.

Automatic adjustment of frequency offset

This function performs automatic frequency offset adjustment when scalar mixer/converter measurements are performed to compensate for LO frequency inaccuracies internal to the DUT.

Familiar graphical user interface

Intuitive graphical user interface ensures fast and easy Analyzer operation.

Printout/saving of traces

The traces and data printout function has a preview feature. Previewing, saving, and printing can be performed using MS Word, Image Viewer for Windows, or the Analyzer Print Wizard.

Linux OS support

The Linux version of the analyzer software is designed to run on x86 PCs running Linux.

Note: Tests must be performed to determine if the Analyzer software is compatible with a particular version of Linux.

COM/DCOM

Remote control via COM/DCOM. COM automation is used when the user program is running on the local PC. DCOM automation is used when  the user program  is running on the LAN-networked PC. Automation of the instrument can be achieved in any COM/DCOM-compatible language or environment, including Python, C++, C#, VB.NET, LabVIEW, MATLAB, Octave, VEE, Visual Basic (Excel), and others.

SCPI

Remote control using textual commands SCPI (Standard Commands for Programmable Instruments). Text messages are delivered over PC networks using HiSLIP or TCP/IP Socket network protocols. VISA Library is recommended to support HiSLIP protocol. The TCP/IP Socket protocol can be supported by the VISA library or directly programmed in any language or environment that supports TCP/IP Sockets. The VISA library is free and widely used software in the field of testing and measurement.