Network Analyzers using S4VNA software

Measured parameters

S11, S12, S13, S14

S21, S22, S23, S24

S31, S32, S33, S34

S41, S42, S43, S44

Absolute power of the incident, reflected or transmitted DUT signals.

DC voltage at each point of the frequency sweep (optional for Cobalt series).

Number of measurement channels

Up to 16 channels. Each channel is represented on the screen as an individual channel window. Each channel has its own stimulus signal settings such as frequency range, number of test points, power level, etc.

Data traces

Up to 16 data traces can be displayed in each channel window. A data trace represents S-parameter of the DUT or absolute power of the incident, reflected or transmitted DUT signals.

Memory traces

Each of the 16 data traces can be saved into memory for further comparison with the current values. Up to 8 memory traces can be created for each data trace.

Data display formats

Logarithmic magnitude, linear magnitude, phase, expanded phase, group delay, SWR, real part, imaginary part, Smith chart format, and polar format.

Sweep type

Linear, logarithmic, and segment frequency sweep, when the stimulus power is a fixed value.

Power sweep

Linear power sweep when the frequency is a fixed value.

CW time sweep

Linear time sweep when the frequency and power are fixed values.

Measured points per sweep

From 2 to 200,001 or to 500,001 depending on model (See corresponding datasheet).

Segment sweep

A frequency sweep within several user-defined segments. Frequency range, number of points, source power, and IF bandwidth can be set for each segment.

Power settings

The power level can be set the same for all ports or individually for each port in the frequency sweep mode when the stimulus power is a fixed value. The power slope depending on frequency can be set to compensate for high-frequency attenuation in cables.

Sweep trigger

Trigger modes: continuous, single, hold. Trigger sources: internal, manual, external, bus.

Trace display

Data trace, memory trace, or simultaneous data and memory traces.

Trace math

Data trace modification by math operations: addition, subtraction, multiplication or division between the data, and memory traces.

Autoscaling

Automatic selection of the scale division and reference level value to have the trace most effectively displayed.

Reference level automatic selection

Automatic selection of the reference level. After selection, the data trace shifts vertically so that the reference level crosses the trace in the middle.

Automatic reference level tracking

Automatic tracking of the reference level after each scan. The tracking method choice is: maximum, minimum, center, or active marker.

Electrical delay

Linear phase correction according the specified electrical delay.

Phase offset

Phase offset by the specified value in degrees.

Calibration

Calibration of a test setup (which includes the Analyzer, cables, and adapters) significantly increases the accuracy of measurements. Calibration allows for correction of errors caused by imperfections in the measurement system: directivity, source, and load match, tracking, and isolation.

Calibration methods

The following calibration methods of various sophistication and accuracy enhancement are available:

•reflection and transmission normalization

•full one-port calibration (SOL)

•one-path two-port calibration

•full two/three/four-port calibration (SOLT)

•TRL calibration

Reflection and transmission normalization

The simplest calibration method. It provides limited accuracy.

Full one-port calibration (SOL)

Method of calibration performed for one-port reflection measurements. It ensures high accuracy.

One-path two-port calibration

Method of calibration performed for reflection and one-way transmission measurements, for example, for measuring S11 and S21 only. It ensures high accuracy for reflection measurements, and reasonable accuracy for transmission measurements.

Full two/three/four-port calibration (SOLT)

Method of calibration performed for full S‑parameter matrix measurement of a two/three/four-port DUT. It ensures high accuracy.

Two/three/four-port TRL calibration

Method of calibration performed for full S‑parameter matrix measurement of a two/three/four-port DUT. LRL and LRM types of this calibration are also supported. It provides higher accuracy than a SOLT calibration.

Mechanical calibration kits

It is possible to select one of the predefined calibration kits of various manufacturers or define additional ones.

Electronic calibration modules

Copper Mountain Technologies’ automatic calibration modules (ACMs) make Analyzer calibration faster and easier than traditional mechanical calibration and provides the highest accuracy.

Sliding load calibration standard

The use of sliding load calibration standard allows significant increase in calibration accuracy at high frequencies compared to a fixed load calibration standard.

Unknown thru calibration standard

The use of an arbitrary reciprocal two-port thru device instead of a defined by parameters thru during a full two/three/four-port calibration allows calibration if the parameters of an available thru are unknown. This method allows calibration of the test setup for measurements of non-insertable devices.

Defining of calibration standards

Different methods of calibration standard definition are available:

•standard definition by polynomial model

•standard definition by database (S-parameters)

Error correction interpolation

When such settings as start/stop frequencies and number of points are changed, compared to the settings of calibration, interpolation or extrapolation of the calibration coefficients will be applied (Extrapolation is not recommended).

Port Extension

Delay compensation in the test setup by moving the calibration plane towards the DUT terminals. Performed separately for each port.

Power calibration

Method of the port power calibration which allows to maintain more stable power levels at the DUT input. The calibration requires connection of an external USB power meter.

Receiver calibration

Method of the receiver gain calibration to the accurate absolute power measurement.

Data markers

Up to 16 markers for each trace. A marker indicates the stimulus value and measurement result at a given point of the trace.

Reference marker

Enables indication of any maker value as relative to the reference marker.

Marker search

Search for max, min, peak, or target values on a trace.

Marker search additional features

User-defined search range. Available as either a tracking marker, or as a one-time search.

Setting parameters by markers

Setting of start, stop, and center frequencies from the marker frequency, and setting of reference level by the measurement result of the marker.

Marker math functions

Statistics, bandwidth, flatness, RF filter.

Statistics

Calculation and display of mean, standard deviation and peak-to-peak values of the trace.

Bandwidth

Determines bandwidth between cutoff frequency points for an active marker or absolute maximum. The bandwidth value, center frequency, lower frequency, higher frequency, Q value, and insertion loss are displayed.

Flatness

Displays gain, slope, and flatness between two markers on a trace.

RF filter

Displays insertion loss and peak-to-peak ripple of the passband, and the maximum signal magnitude in the stopband. The passband and stopband are defined by two pairs of markers.

Port impedance conversion

This function converts S-parameters measured at the Analyzer’s nominal port impedance into values which would be found if measured at arbitrary port impedance.

De-embedding

This function allows mathematical exclusion of the effects of the fixture circuit connected between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.

Embedding

This function allows mathematical simulation of the DUT parameters after virtual insertion of a fixture circuit between the calibration plane and the DUT. This circuit should be described by an S-parameter matrix in a Touchstone file.

S-parameter conversion

This function allows conversion of the measured S-parameters to the following parameters: reflection impedance and admittance, transmission impedance and admittance, and inverse S-parameters.

Time domain transformation

This function performs transformation from frequency domain into response of the DUT to various stimulus types in time domain. Modeled stimulus types: bandpass impulse, lowpass impulse, and lowpass step. Time domain span is set arbitrarily from zero to maximum, which is determined by the frequency steps. Various window shapes allow optimizing the tradeoff between resolution and the level of spurious sidelobes.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Time domain gating

This function mathematically removes unwanted responses in time domain, allowing for measurement of the frequency response without the influence of selected fixture elements. Gating filter types: bandpass or notch. For better tradeoff between gate resolution and the level of spurious sidelobes the following filter shapes are available: maximum, wide, normal, and minimum.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Measurement of Balanced Devices

These measurements include the following function:

•Balance-Unbalance Conversion mathematically simulates measurements of the balanced circuits using the results of unbalanced measurements.

•Differential Port Matching function simulates the embedding of a matching circuit in a balanced port generated by a balance-unbalance conversion function.

•Port Reference Impedance Conversion for Balanced Connection function changes the reference impedance for each test logical balanced port to an arbitrary value.

Scalar mixer / converter measurements

The scalar method allows measurement of scalar transmission S-parameters of mixers and other devices having different input and output frequencies. No external mixers or other devices are required. The scalar method employs port frequency offset when there is a difference between receiver frequency and source frequency.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Vector mixer / converter measurements

The vector method allows measuring of the mixer transmission S-parameter magnitude and phase. The method requires an external reference mixer and an LO common to both the external reference mixer and the mixer under test.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Scalar mixer / converter calibration

The most accurate method of calibration applied for measurements of mixers in frequency offset mode. OPEN, SHORT, and LOAD calibration standards are used. An external power meter is required and should be connected to the USB port directly or via USB/GPIB adapter.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Vector mixer /converter calibration

Method of calibration applied for vector mixer measurements. OPEN, SHORT, and LOAD calibration standards are used.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Automatic adjustment of frequency offset

This function performs automatic frequency offset adjustment when scalar mixer / converter measurements are performed to compensate for LO frequency inaccuracies internal to the DUT.

The availability of this feature depends on the Analyzer model (See corresponding datasheet).

Auxiliary Source

This function uses a free Analyzer port as an auxiliary signal source.

Familiar graphical user interface

Intuitive graphical user interface ensures fast and easy Analyzer operation.

Printout/saving of traces

The traces and data printout function has a preview feature. Previewing, saving, and printing can be performed using MS Word, Image Viewer for Windows, or the Analyzer Print Wizard.

Linux OS support

The Linux version of the Analyzer software is designed to run on x86 PCs running Linux.

Note: Tests must be performed to determine if the analyzer software is compatible with a particular version of Linux.

COM/DCOM

Remote control via COM/DCOM. COM automation is used when the software is running on the local PC. DCOM automation is used when the software is running on the LAN-networked PC. Automation of the instrument can be achieved in any COM/DCOM-compatible language or environment, including Python, C++, C#, VB.NET, LabVIEW, MATLAB, Octave, VEE, Visual Basic (Excel), and others.

SCPI

Remote control using textual commands SCPI (Standard Commands for Programmable Instruments). Text messages are delivered over PC networks using HiSLIP or TCP/IP Socket network protocols. VISA Library is recommended to support HiSLIP protocol. The TCP/IP Socket protocol can be supported by the VISA library or directly programmed in any language or environment that supports TCP/IP Sockets. The VISA library is free and widely used software in the field of testing and measurement.