Traces can be displayed in one diagram, overlapping each other, or in separate diagrams within a channel window (See figures below).
Displaying two traces on the same diagram |
Displaying two traces on two different diagrams |
The trace settings are made in two steps: trace number and trace layout within the channel window. By default, the channel window contains one trace. If two or more traces need to be enabled, the number of traces can be set as described below.
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To set the number of the traces, use the following softkeys: Display > Num Of Traces Then select the number of traces from the menu. |
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All traces are assigned individual names, which cannot be changed. The trace name contains its number. The trace names are as follows: Tr1, Tr2, ... Tr16.
Each trace is assigned the following initial settings: measured parameter, format, scale, and color, which can be modified:
•The measured parameters of the first four traces default to the following values: S11, S21, S12, S22. For a detailed description of changing measured parameter see S Parameter.
•By default, the display format for all traces is set to logarithmic magnitude (dB). For a detailed description of changing display format see Format Setting.
•By default, the scale parameters are set as follows: division is set to 10 dB, reference level value is set to 0 dB, and the reference level position is in the middle of the diagram. For a detailed description of changing scale parameters see Scale Settings.
•The trace color is determined by its number. This color can be changed. For a detailed description of changing color see Set Color.
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The full cycle of the trace update depends on the S-parameters measured and the calibration method. For example, the full cycle might consist of a single sweep with either Port 1 or Port 2 as the source, or it might include two successive sweeps of Port 1 then of Port 2. To have two traces (S11 and S22) measured, two successive sweeps need to be performed. Two successive sweeps are also performed when full two-port calibration is employed, independently of the number of the traces and S-parameters measured. |
